The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Dec. 31, 2014
Applicant:

Harbin Institute of Technology, Harbin, CN;

Inventors:

Jiwen Cui, Harbin, CN;

Junying Li, Harbin, CN;

Kunpeng Feng, Harbin, CN;

Jiubin Tan, Harbin, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01B 11/00 (2006.01); G01B 5/012 (2006.01); G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
G01B 11/007 (2013.01); G01B 5/012 (2013.01); G01B 11/18 (2013.01);
Abstract

A method and equipment based on detecting the polarization property of a polarization maintaining fiber (PMF) probe for measuring structures of a micro part are provided. The provided method relates to how to accomplish measuring structures of a micro part by transforming two or three-dimensional contact displacements into polarization property changes of the PMF probe, and how to reconstruct the structure geometry of a micro part. The provided equipment can be used to bring the spherical tip of the PMF probe into contact with a micro part, to determine coordinates of contact points, and to reconstruct the structure geometry of a micro part. The provided method and equipment feature high sensitivity, low probing force, high inspecting aspect ratio and immunity to environment interference.


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