The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
May. 19, 2009
Applicants:
Nicholas John Weston, Peebles, GB;
Alexander David Mckendrick, East Kilbride, GB;
Inventors:
Nicholas John Weston, Peebles, GB;
Alexander David McKendrick, East Kilbride, GB;
Assignee:
RENISHAW PLC, Wotton-under-Edge, GB;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/007 (2013.01); G01B 11/24 (2013.01);
Abstract
An optical inspection probe for obtaining and providing images of an object to be inspected. The optical inspection probe comprises an imaging assembly for capturing an image of an object and an illumination assembly for producing a light beam directed toward the object. The optical inspection probe is configured such that the light beam converges to a focal point at a first focal plane.