The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Sep. 16, 2010
Takashi Nishihara, Tokyo, JP;
Hiroyuki Itagaki, Tokyo, JP;
Tomohiro Goto, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
A high-quality image is obtained using a two-dimensional selective excitation method even if the static magnetic field is not uniform. Therefore, non-uniformity of a static magnetic field of a region to be focused in particular in a selective excitation region excited by 2DRF is measured, and a result of the measurement is reflected in an imaging sequence using the 2DRF. For example, a resonance frequency of magnetization obtained from the measurement result is set as an irradiation frequency of the 2DRF. In addition, a shim gradient magnetic field is applied so as to correct the non-uniformity of the magnetization obtained from the measurement result. These are applied only in the imaging sequence using the 2DRF, and an irradiation frequency and a shim gradient magnetic field set in a conventional method are used in other imaging sequences.