The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Dec. 22, 2014
Carl Zeiss Meditec Ag, Jena, DE;
Carl Zeiss Ag, Oberkochen, DE;
CARL ZEISS MEDITEC AG, Jena, DE;
CARL ZEISS AG, Oberkochen, DE;
Abstract
An eye surgery microscopehaving an illumination beam pathfor imaging a portion of an eyeof a patient and a measurement beam pathfor measuring an ametropia of the eye. The microscope comprises an objective lenshaving an objective planein which the eye of the patient is disposable; at least one ocularor a camerafor generating and detecting an image of the object plane, respectively; a measurement light source for generating a measurement light beam; a measurement modulehaving a light detector; optics traversed by the measurement beam path for directing the measurement light beam onto the retinaof the eye of the patient and for providing measurement lightreflected at the retina to the measurement module; and a controller; wherein the measurement module and the controller are configured to determine a position of an image of the retina generated by the optics along the measurement beam path and to output a measurement value representing the ametropia of the eye of the patient.