The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Nov. 19, 2014
Applicants:

University of Rochester, Rochester, NY (US);

The Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);

Inventors:

Jinxin Huang, Rochester, NY (US);

Jannick P. Rolland, Pittsford, NY (US);

Eric Clarkson, Tucson, AZ (US);

Matthew Kupinski, Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/113 (2006.01);
U.S. Cl.
CPC ...
A61B 3/101 (2013.01); A61B 3/0025 (2013.01); A61B 3/102 (2013.01); A61B 3/113 (2013.01);
Abstract

Systems and methods for determining thickness of lipid and aqueous layers of a tear film in which a spectrum array is generated from optical coherence tomography and input into a statistical estimator, which determines the thickness of the lipid and/or aqueous layers at a nanometer resolution based on the inputted spectrum and other information, such as information about a laser intensity noise, Poisson noise, and dark noise associated with the OCT.


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