The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Oct. 24, 2012
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Christophe Gisquet, Rennes, FR;

Edouard François, Bourg des Comptes, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 19/186 (2014.01); H04N 19/196 (2014.01); H04N 19/105 (2014.01); H04N 19/176 (2014.01); H04N 19/593 (2014.01); H04N 19/11 (2014.01); H04N 19/117 (2014.01); H04N 19/463 (2014.01); H04N 19/137 (2014.01);
U.S. Cl.
CPC ...
H04N 19/198 (2014.11); H04N 19/105 (2014.11); H04N 19/11 (2014.11); H04N 19/117 (2014.11); H04N 19/137 (2014.11); H04N 19/176 (2014.11); H04N 19/186 (2014.11); H04N 19/463 (2014.11); H04N 19/593 (2014.11);
Abstract

A method for processing components of an image for coding a sample of the image, the image being composed of a first type of component and a second type of component, wherein samples of the second type of component are predictable from samples of the first type of component using a prediction model, computing one parameter value for use in representing, in the prediction model, the link between the first type of component and the second type of component; detecting, whether or not, one type of error exists in one such computed parameter value of the prediction model and in the case where a first type of error is detected; adapting the computed parameter value to correct for the error detected; and predicting a sample of the second type from a sample of the first type using the prediction model and the adapted parameter value.


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