The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Mar. 13, 2014
Applicant:

Drs Rsta, Inc., Melbourne, FL (US);

Inventors:

Richard L. Southerland, Plano, TX (US);

Mark E. Durham, Palm Bay, FL (US);

Patrick J. Cronkite, Palm Bay, FL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 3/06 (2006.01); H04N 5/33 (2006.01); G02B 7/38 (2006.01); G02B 13/14 (2006.01); G03B 3/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01); G02B 7/38 (2013.01); G02B 13/14 (2013.01); G03B 3/00 (2013.01);
Abstract

The disclosure describes systems and apparatuses that include a focusable lens, as well as methods for focusing the optical lens. The focusable lens system includes a single element lens having a concave refractive surface characterized by a first radius of curvature and a convex refractive surface characterized by a second radius of curvature larger than the first radius of curvature. A detector element generates electrical signals representative of infrared rays refracted by the single element lens and incident on the detector element, and an aperture stop is disposed around an optical axis of the optical system and secured in a constant position relative to the detector element, the aperture stop configured to limit a cone angle of rays refracted by the single element lens. They system also includes image processing circuitry configured to generate digital pixilation data based on electrical signals generated by the detector element.


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