The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Mar. 25, 2016
Applicant:

VT Idirect, Inc., Herndon, VA (US);

Inventors:

Ronggang Qi, Broadlands, VA (US);

Baoyan Ding, Potomac, MD (US);

Assignee:

VT IDIRECT, INC., Herndon, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/10 (2006.01); H04L 7/00 (2006.01); H04L 25/02 (2006.01); H04L 27/00 (2006.01);
U.S. Cl.
CPC ...
H04B 1/10 (2013.01); H04L 7/0041 (2013.01); H04L 25/0228 (2013.01); H04L 27/0014 (2013.01);
Abstract

A device and method for unwrapping phase samples of a burst signal. The device generates a set of vectors including phase samples. A first mean and a first variance of the vectors is computed, and a set of unwrapped phase samples of the burst signal are computed by rotating phase samples of the vector having a smallest first variance by a first rotation amount. The set of vectors is updated based on a new phase sample and a second mean and a second variance of the updated set of vectors is computed. Differences between unwrapped phase samples and a number of phase samples included in the vector having the smallest computed second variance are computed. A next unwrapped phase sample is generated by rotating the new phase sample by a second rotation amount corresponding to a median value of the computed differences.


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