The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2017
Filed:
Apr. 13, 2015
Hong Kong Baptist University, Hong Kong, HK;
Kin Long Chan, Hong Kong, HK;
Gui Xin Li, Hong Kong, HK;
Ka Suen Lee, Hong Kong, HK;
Kok Wai Cheah, Hong Kong, HK;
Hong Kong Baptist University, Hong Kong, HK;
Abstract
This invention provides a system and a method for measuring displacements and movements, particularly for measuring very fine displacements and very minute movements. Position, vibration and rotational/angular movements can be measured. One or more directions can be measured simultaneously. In one embodiment, the system comprises one or more measuring means at least configured to tune multiple color emissions from a laser comprising an organic laser and/or a cascaded organic laser, such that the tuned multiple color emissions of the laser are used in measurements. The system is scalable in order to support measurement across a very large space. Optionally, the system further comprises a thin film laser generating device for generating said laser, blue and green emission organic semiconductors for generating said organic laser, and laser sensors for sensing said laser where said laser sensors comprise organic laser sensors and/or cascaded organic laser sensors.