The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2017
Filed:
Aug. 11, 2014
Raytheon Company, Waltham, MA (US);
Thomas J. McDevitt, Natick, MA (US);
David A. Brennan, Maynard, MA (US);
Curtis Combs, Guntersville, AL (US);
Christopher A. Hamner, Huntsville, AL (US);
Macdonald J. Andrews, East Douglas, MA (US);
Joseph D. Corn, Grafton, MA (US);
Raytheon Company, Waltham, MA (US);
Abstract
A system for calibrating an array antenna comprises a calibration antenna at a first location relative to an array antenna, a first set of calibration files, and a processor. Based on received far field data from a far field data test that was run on the array antenna, using the calibration antenna, the processor is configured to generate a model predicting the actual location of the calibration antenna relative to the array antenna and to generate predicted far field data based on the model. The model is adjusted, if needed, by comparing the predicted far field data with the received far field data. Based on the model, new calibration files are generated that substantially correlate to the actual location of the calibration antenna.