The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Mar. 09, 2015
Applicant:

Sandisk Technologies Llc, Dallas, TX (US);

Inventors:

Jack Edward Frayer, Boulder Creek, CA (US);

Vidyabhushan Mohan, San Jose, CA (US);

Assignee:

SANDISK TECHNOLOGIES LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G11C 29/00 (2006.01); G11C 29/08 (2006.01); H01L 25/00 (2006.01); H01L 25/065 (2006.01); G11C 29/10 (2006.01); G11C 29/44 (2006.01); G11C 29/04 (2006.01); G11C 16/00 (2006.01);
U.S. Cl.
CPC ...
G11C 29/08 (2013.01); G11C 29/006 (2013.01); G11C 29/04 (2013.01); G11C 29/10 (2013.01); G11C 29/44 (2013.01); H01L 25/0657 (2013.01); H01L 25/50 (2013.01); G11C 16/00 (2013.01); G11C 2029/0403 (2013.01); H01L 2924/0002 (2013.01);
Abstract

The various embodiments described herein include systems, methods and/or devices used to package non-volatile memory. In one aspect, the method includes: (1) selecting, from a set of non-volatile memory die, a plurality of non-volatile memory die on which one or more tests have been deferred until after packaging, the selecting in accordance with wafer positions of the plurality of non-volatile memory die and statistical die performance information corresponding to the wafer positions; and (2) packaging the selected plurality of non-volatile memory die. In some embodiments, after said packaging, the method further includes performing a set of tests on the plurality of non-volatile memory die to identify respective units of memory within the plurality of non-volatile memory die that meet predefined validity criteria, wherein the set of tests performed include at least one of the deferred one or more tests.


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