The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Jan. 03, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Kyungryun Kim, Seoul, KR;

Sangyong Yoon, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/56 (2006.01); G11C 16/34 (2006.01); G11C 16/04 (2006.01); G11C 29/02 (2006.01); G06F 11/10 (2006.01); H01L 27/11578 (2017.01); H03M 13/37 (2006.01);
U.S. Cl.
CPC ...
G11C 11/5642 (2013.01); G06F 11/1012 (2013.01); G06F 11/1048 (2013.01); G11C 16/0483 (2013.01); G11C 16/349 (2013.01); G11C 16/3418 (2013.01); G11C 16/3427 (2013.01); G11C 29/028 (2013.01); H01L 27/11578 (2013.01); H03M 13/373 (2013.01); G11C 2211/5644 (2013.01);
Abstract

In one embodiment, the method includes performing a read operation on a memory, and determining, by a memory controller, whether to perform a reliability verification read operation based on a count value and a reference value. The count value is based on a number of read commands issued by the memory controller to the memory, and the reliability verification read operation is for reading data from at least one memory cell associated with at least one unselected word line in the memory. An unselected word line is a word line not selected during the read operation. The method further includes performing the reliability verification read operation for the at least one unselected word line based on the determining.


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