The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2017
Filed:
Dec. 21, 2015
Industrial Technology Research Institute, Hsinchu, TW;
Ya-Hui Tsai, Taoyuan, TW;
Wei-Yao Chiu, Chiayi, TW;
Chin-Kuei Chang, Taipei, TW;
Yu-Ting Lin, New Taipei, TW;
Keng-Hao Chang, Taichung, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
The present disclosure discloses a method for suturing 3D coordinate information. The method includes disposing a correction block on a test platform; capturing first 3D coordinate information represented by a first viewing angle and second 3D coordinate information represented by a second viewing angle from the correction block; determining a first center coordinate of the first 3D coordinate information and a second center coordinate of the second 3D coordinate information; superimposing the first 3D coordinate information to the second 3D coordinate information to form first overlap 3D coordinate information; suturing the first 3D coordinate information into the second 3D coordinate information to form a first 3D coordinate suturing result according to an iterative closet point algorithm; and determining a first transformation relation of the first viewing angle versus the second viewing angle according to the first 3D coordinate information and the first 3D coordinate suturing result.