The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2017
Filed:
Nov. 14, 2014
Image analyzing device, image analyzing method, and recording medium storing image analyzing program
Yuka Kihara, Kanagawa, JP;
Hiroshi Shimura, Kanagawa, JP;
Yuka Kihara, Kanagawa, JP;
Hiroshi Shimura, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An image analyzing device, an image analyzing method, and a recording medium storing an image analyzing program are provided. Each of the image analyzing device, the image analyzing method, and the recording medium storing the image analyzing program recognizes an area where a target is displayed based on a feature value of an input image, generates space recognition information to recognize spatial properties of each portion of the input image, divides the image into a plurality of similar areas according to similarity in feature value of the input image, the similar area having a similar feature value, obtains specified attribute data of the spatial properties to be referred to, from image areas around the recognized area where the target is displayed, recognizes the spatial properties according to the space recognition information, and determines whether a result of recognition is appropriate at the portion where the target is displayed.