The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2017
Filed:
Nov. 01, 2013
Applicant:
Vidinoti SA, Fribourg, CH;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00201 (2013.01); G06T 7/0036 (2013.01); G06T 7/0085 (2013.01); G06T 7/0095 (2013.01); G06T 2200/21 (2013.01); G06T 2207/10052 (2013.01); G06T 2207/20061 (2013.01); G06T 2207/20164 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/20228 (2013.01);
Abstract
A method of local feature identification comprises retrieving data representing a lightfield, forming an epipolar volume (V) from the retrieved data, applying a transform to epipolar planes retrieved from the epipolar volume, so as to represent the epipolar planes in a new space, identifying a plurality of epipolar lines, and identifying local features (fp) based on at least some of the epipolar lines.