The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Nov. 07, 2013
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Mei-Yuh Hwang, Beijing, CN;

Yong Ni, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/28 (2006.01); G06F 17/00 (2006.01); G06F 17/20 (2006.01); G06F 17/21 (2006.01); G06F 9/44 (2006.01); G06Q 10/00 (2012.01); G06Q 50/00 (2012.01); G10L 15/00 (2013.01); G10L 13/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/28 (2013.01);
Abstract

Annotated training data (e.g., sentences) in a first language are used to generate annotated training data for a second language. For example, annotated sentences in English are manually collected first, and then is used to generate annotated sentences in Chinese. The annotated training data includes slot labels, slot values and carrier phrases. The carrier phrases are the portions of the training data that is outside of a slot. The carrier phrases are translated from the first language to one or more translations in the second language. The translations may include machine translations as well as human translations. Entities for the slot values are determined for the translated sentences using content sources that include locale-dependent entities. The determined entities are used to fill the slots in the translations of the second language. All or a portion of the resulting sentences may be used for training models in the second language.


Find Patent Forward Citations

Loading…