The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Sep. 05, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Eisuke Kanzaki, Kanagawa-ken, JP;

Kaori Maruyama, Ibaraki-ken, JP;

Tetsuo Namba, Tokyo, JP;

Hideo Takeda, Kanagawa-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/263 (2006.01); G06F 17/27 (2006.01);
U.S. Cl.
CPC ...
G06F 17/27 (2013.01);
Abstract

Techniques for automatically generating test data solve various problems in test data generation. A technique of automatically generating test data includes receiving a signature to be embedded in at least one character string to be generated and determining a total sum of attribute values intrinsic to characters in the character string. The sum is associated with each element of the signature. At least one of the characters in the character string may be selected from a character table describing characters prepared to create the test data so as to achieve the determined total sum for each element of the signature. The generated test data contains the character string including the selected character.


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