The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2017
Filed:
Sep. 05, 2012
Vincent C. Smith, Seattle, WA (US);
Nathaniel E. Ayewah, Seattle, WA (US);
Donn S. Terry, Woodinville, WA (US);
Yue Yang, Redmond, WA (US);
David J. Sielaff, Seattle, WA (US);
Mansi S. Rajkondawar, Redmond, WA (US);
Sunny Chatterjee, Bothell, WA (US);
Vincent C. Smith, Seattle, WA (US);
Nathaniel E. Ayewah, Seattle, WA (US);
Donn S. Terry, Woodinville, WA (US);
Yue Yang, Redmond, WA (US);
David J. Sielaff, Seattle, WA (US);
Mansi S. Rajkondawar, Redmond, WA (US);
Sunny Chatterjee, Bothell, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
In embodiments of determining relevant events in source code analysis, a computing device includes a key event manager that is implemented to traverse executable paths in source code of executable software instructions, log events along the executable paths in the source code, and determine a defect in the source code along an executable path in the source code. A state machine is implemented to traverse back through the logged events and determine relevant events that are associated with the defect in the source code. An analysis output of the relevant events can then be generated to indicate the defect in the source code and a cause of the defect.