The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2017
Filed:
Apr. 04, 2008
Ying Chen, Beijing, CN;
Jing Luo, Beijing, CN;
John Arthur Pershing, Jr., Cortlandt Manor, NY (US);
Jie Qiu, Beijing, CN;
Ying Chen, Beijing, CN;
Jing Luo, Beijing, CN;
John Arthur Pershing, Jr., Cortlandt Manor, NY (US);
Jie Qiu, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Techniques are disclosed for workflow based high availability analysis in computing systems. For example, a computer-implemented method for analyzing an information network infrastructure to identify one or more availability weak points includes the following steps. A workflow specification is provided based on one or more user-visible processes and an application topology. Service workflows associated with the specification are mapped from the application topology to the infrastructure to generate a workflow data structure. An availability weak point analysis is performed in accordance with the workflow data structure to determine one or more optimal high availability parameters for one or more deployed components of the infrastructure. The one or more optimal high availability parameters are applied in the infrastructure so as to substantially eliminate the one or more availability weak points.