The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2017
Filed:
Feb. 13, 2012
Applicant:
Nan-kuei Chen, Cary, NC (US);
Inventor:
Nan-kuei Chen, Cary, NC (US);
Assignee:
Duke University, Durham, NC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/32 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/32 (2013.01); G01R 33/5613 (2013.01); G01R 33/5616 (2013.01);
Abstract
Methods, systems, computer programs, circuits and workstations are configured to generate MRI images using an Echo-Planar Double-Echo Steady State (EP-DESS) pulse sequence and/or a Repeated Imaging with Echo-planar Navigation and Acceleration (RIENA) pulse sequence and image processing protocol to generate clinical MRI images.
Chen, Nan-kuei. (2017). High-throughput and motion insensitive mri accelerated with multi-echo planar acquisition and related systems (U.S. Patent No. 9612301). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9612301
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile