The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Feb. 12, 2014
Applicant:

Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);

Inventors:

Chris Thomas Zimmerle, Goshen, IN (US);

Gary W. Rheinheimer, Goshen, IN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/78 (2006.01); G01N 33/72 (2006.01); G01N 21/25 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01N 33/728 (2013.01); G01N 21/253 (2013.01); G01N 21/78 (2013.01); G01N 21/274 (2013.01); Y10T 436/146666 (2015.01);
Abstract

Methods and systems are disclosed including a reagent analyzer, comprising a test analyzing mechanism, such as an optical imaging system, configured to read a first sample of a specimen combined with a reagent configured to react with the sample in a presence of an analyte of interest and a second sample of the specimen that is not combined with a reagent, and to output one or more first signals indicative of the test analyzing mechanism reading the first and second samples; and a processor receiving the one or more first signals and executing logic to analyze the second sample responsive to the processor determining that the analyte of interest is present in the first sample. The processor may execute logic to analyze the second specimen utilizing one or more ratio algorithm and comparing the results of the algorithm against predetermined values indicative of expected color.


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