The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2017
Filed:
Oct. 03, 2014
Applicant:
Massey University, Auckland, NZ;
Inventors:
Mack Saraswat, Auckland, NZ;
John Andrew Harrison, Auckland, NZ;
Ralph Stefan Grand, Auckland, NZ;
Frazer Kingsley Noble, Auckland, NZ;
Lutz Robert Gehlen, Auckland, NZ;
Matthew Alan Woods, Auckland, NZ;
Sam Bartho, Auckland, NZ;
Assignee:
MASSEY UNIVERSITY, Auckland, NZ;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/51 (2006.01); G01N 21/59 (2006.01);
U.S. Cl.
CPC ...
G01N 21/51 (2013.01); G01N 21/5907 (2013.01); G01N 2201/0212 (2013.01); G01N 2201/0227 (2013.01);
Abstract
The present invention relates to optical measurement devices and systems, and methods of using these systems and devices, and more particularly but not exclusively it relates to a system and apparatus adapted to measure optical properties in-situ.