The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Jan. 21, 2015
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Barbara A. Capron, Sammamish, WA (US);

Benjamin E. C. Koltenbah, Federal Way, WA (US);

Claudio G. Parazzoli, Seattle, WA (US);

Assignee:

THE BOEING COMPANY, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/64 (2006.01); G01J 9/00 (2006.01); G01J 1/04 (2006.01);
U.S. Cl.
CPC ...
G01J 9/00 (2013.01); G01J 1/0429 (2013.01);
Abstract

The present disclosure generally relates to techniques for measuring a phase difference between a first set of photons and a second set of photons. The techniques can include directing the first set of photons to a first parametric downconverter, directing the second set of photons to a second parametric downconverter, directing photons output from an exotic photon source to the first downconverter and directing photons output from the first parametric downconverter to a first beam splitter, directing photons output from an exotic photon source to the first beam splitter, directing photons output from the second parametric downconverter to a second beam splitter, directing photons output from the first beam splitter to the second beam splitter, detecting photons output from the second beam splitter, deriving, from the detecting, a phase difference between the first set of photons and the second set of photons, and outputting the phase difference.


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