The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Nov. 24, 2015
Applicant:

Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;

Inventors:

Yoichi Kawada, Hamamatsu, JP;

Takashi Yasuda, Hamamatsu, JP;

Hironori Takahashi, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01J 1/44 (2006.01); G01J 4/04 (2006.01); G01J 1/42 (2006.01); G01J 1/04 (2006.01); G01J 3/433 (2006.01); G01J 3/42 (2006.01); G01J 3/02 (2006.01); G01R 15/24 (2006.01); G01R 29/08 (2006.01); G01N 21/3581 (2014.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G01J 1/0429 (2013.01); G01J 1/4228 (2013.01); G01J 3/0224 (2013.01); G01J 3/0262 (2013.01); G01J 3/42 (2013.01); G01J 3/433 (2013.01); G01J 3/4338 (2013.01); G01J 4/04 (2013.01); G01J 2001/4242 (2013.01); G01N 21/3581 (2013.01); G01R 15/241 (2013.01); G01R 29/0871 (2013.01);
Abstract

In this electric field vector detection method, an electro-optic crystal, where a (111) surface of an optical isotropic medium is cut out, is used as a terahertz wave detection element. The method includes: causing polarization of probe light of ultrashort pulsed light to be circular polarization; allowing the probe light having circular polarization to enter the terahertz wave detection element and probing the terahertz wave; modulating the probe light, having probed the terahertz wave, by a rotating analyzer and detecting the modulated probe light by a photodetector; performing lock-in detection of a detection signal from the photodetector by a lock-in detector using a frequency based on a rotational frequency of the rotating analyzer as a reference signal; and detecting an electric field vector of the terahertz wave based on a detection signal from the lock-in detector.


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