The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9612112 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 04, 2017

Filed:

Feb. 25, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Hiroyuki Yuki, Utsunomiya, JP;

Takashi Seki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01); G01N 21/55 (2014.01); G01N 21/57 (2006.01);
U.S. Cl.
CPC ...
G01B 11/306 (2013.01); G01B 11/303 (2013.01); G01N 21/57 (2013.01); G01N 21/55 (2013.01); G01N 2201/061 (2013.01); G01N 2201/068 (2013.01);
Abstract

An optical system comprising: a light source; a photodetector; a first light-receiving system for causing the photodetector to receive first reflected light with a first angle of reflection from a surface; and a second light-receiving system for causing the photodetector to receive second reflected light with a second angle of reflection, different from the first angle of reflection, from the surface is provided. Here, an incident area on the surface, in which light generating the first reflected light is incident, is spaced apart from an exiting area on the surface, which light, to be incident on the photodetector from the surface via the second light-receiving system, exits.


Find Patent Forward Citations

Yuki, Hiroyuki. (2017). Optical system and optical quality measuring apparatus (U.S. Patent No. 9612112). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9612112

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