The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Feb. 07, 2013
Applicant:

Ihi Corporation, Koto-ku, Tokyo, JP;

Inventors:

Michiko Baba, Tokyo, JP;

Kiyofumi Fujimura, Tokyo, JP;

Toshihiro Hayashi, Tokyo, JP;

Norimasa Taga, Tokyo, JP;

Assignee:

IHI Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 11/12 (2006.01); G01B 11/24 (2006.01); G02B 5/00 (2006.01); G02B 23/24 (2006.01); G01N 21/954 (2006.01);
U.S. Cl.
CPC ...
G01B 11/12 (2013.01); G01B 11/24 (2013.01); G02B 5/001 (2013.01); G02B 23/2423 (2013.01); G01N 2021/9544 (2013.01);
Abstract

An inner diameter measuring device for measuring a shape of an inner surface of a cylindrical member, comprising an image pickup unit () disposed on a base end side of a frame unit () and for picking up an image of a forward end side, a cone mirror unit () provided on a forward end side of the frame unit and having a cone mirror () with a conical reflection surface at a forward end, and a laser beam emitting unit () for emitting a laser beam () toward a forward end of the cone mirror, wherein the cone mirror unit can be replaced by another cone mirror unit having a cone mirror with a different vertical angle to suit measuring condition.


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