The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Mar. 14, 2012
Applicants:

Christopher John Russo, Cambridge, GB;

Jene Golovchenko, Lexington, MA (US);

Daniel Branton, Lexington, MA (US);

Inventors:

Christopher John Russo, Cambridge, GB;

Jene Golovchenko, Lexington, MA (US);

Daniel Branton, Lexington, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 21/30 (2006.01); B81C 1/00 (2006.01); G01N 33/487 (2006.01);
U.S. Cl.
CPC ...
B81C 1/00087 (2013.01); G01N 33/48721 (2013.01); B81B 2201/0214 (2013.01); B81B 2203/0127 (2013.01); B81B 2207/056 (2013.01);
Abstract

In a method of forming a nanopore in a nanometric material, a nanopore nucleation site is formed at a location that is interior to lateral edges of the nanometric material by directing a first energetic beam, selected from the group of ion beam and neutral atom beam, at the interior location for a first time duration that imposes a first beam dose which causes removal of no more than five interior atoms from the interior location to produce at the interior location a nanopore nucleation site having a plurality of edge atoms. A nanopore is then formed at the nanopore nucleation site by directing a second energetic beam, selected from the group consisting of electron beam, ion beam, and neutral atom beam, at the nanopore nucleation site with a beam energy that removes edge atoms at the nanopore nucleation site but does not remove bulk atoms from the nanometric material.


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