The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Mar. 06, 2014
Applicant:

Fujikura, Ltd., Koto-ku, Tokyo, JP;

Inventor:

Naritoshi Yamada, Sakura, JP;

Assignee:

FUJIKURA, LTD., Koto-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65H 63/036 (2006.01); G01M 11/08 (2006.01);
U.S. Cl.
CPC ...
B65H 63/036 (2013.01); G01M 11/088 (2013.01); B65H 2701/32 (2013.01);
Abstract

An optical fiber screening test method in which while continuously travelling, an optical fiber passes a tension applying section which applies tension and the optical fiber which has passed the tension applying section is continuously wound by a winding bobbin is provided. The method includes running the optical fiber to which the tension has been applied along a first pulley and a second pulley sequentially, winding the optical fiber by the winding bobbin, and stopping rotation of the winding bobbin when the optical fiber is broken by applying the tension, and performing an adjustment so that an already-wound outer circumferential surface of the winding bobbin on which the optical fiber is already wound is not positioned on an extension line of a linear optical fiber travelling path from the first pulley to the second pulley at a time when the rotation of the winding bobbin is stopped.


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