The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Jul. 24, 2013
Applicant:

Zte Corporation, Shenzhen, Guangdong Province, CN;

Inventors:

Boming Wang, Shenzhen, CN;

Xiangling Li, Shenzhen, CN;

Changjiang Cao, Shenzhen, CN;

Xiangzi Han, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04W 24/08 (2009.01); H04B 17/12 (2015.01); H04B 17/15 (2015.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04B 17/12 (2015.01); H04B 17/15 (2015.01);
Abstract

A method and apparatus for testing a radio frequency index of an active antenna system are provided. In the method, a tested active antenna system is placed in a test cover for performing radio frequency index testing, wherein, the test cover includes an antenna array part and a passive network part, and the antenna array part and the antenna feeder part of the tested active antenna system are the same. The method for testing includes: monomer calibration of the test cover; near-field coupling calibration; and radio frequency index testing. With the above-mentioned method and apparatus for testing the radio frequency index of the active antenna system, the radio frequency index of the active antenna system can be directly and effectively measured without need of adding an extra test interface.


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