The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Aug. 05, 2015
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Yasuyuki Matsushita, Beijing, CN;

Stephen Ssu-te Lin, Beijing, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/217 (2011.01); G06T 5/00 (2006.01); H04N 5/357 (2011.01); H04N 5/232 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/217 (2013.01); G06T 5/002 (2013.01); H04N 5/2178 (2013.01); H04N 5/23229 (2013.01); H04N 5/357 (2013.01); H04N 17/002 (2013.01);
Abstract

Technologies that enable correcting for the non-linear relationship between scene irradiance and digital pixel intensity values of an image of the scene produced by a camera. Imaging noise is used as a signal from which a corrective function is derived. Noise distributions from the image are evaluated to determine the radiometric response function of the camera, from which an inverse response function is computed and used for calibration.


Find Patent Forward Citations

Matsushita, Yasuyuki. (2017). Radiometric calibration from noise distributions (U.S. Patent No. 9609180). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9609180

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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