The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Dec. 14, 2015
Rie Suzuki, Kanagawa, JP;
Hideaki Suzuki, Kanagawa, JP;
Rie Suzuki, Kanagawa, JP;
Hideaki Suzuki, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
A read image processing apparatus is provided for processing a read image read by line image sensors arranged such that one end parts of which adjacent to each other are overlapped in a sub-scanning direction. The read image processing apparatus includes a density variation detector, a seam processor, and a line image generator. The density variation detector detects whether a density variation occurs for not less than a predetermined number of times or not in each of a plurality of regions in a seam-read image. The seam processor generates a seam image by synthesizing the seam-read images read by the line image sensors adjacent to each other in accordance with a detection result made by the density variation detector. The line image generator generates a read image corresponding to one line based on read images read by the line image sensors and the seam image generated by the seam processor.
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