The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Jun. 01, 2016
Applicant:

Analog Devices, Inc., Norwood, MA (US);

Inventors:

Hongxing Li, Andover, MA (US);

Junhua Shen, Wilmington, MA (US);

Michael Mueck, Andover, MA (US);

Michael C. W. Coln, Lexington, MA (US);

Assignee:

Analog Devices, Inc., Norwood, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 1/06 (2006.01); H03M 1/14 (2006.01); H03M 1/12 (2006.01); H03M 1/46 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1009 (2013.01); H03M 1/069 (2013.01); H03M 1/124 (2013.01); H03M 1/145 (2013.01); H03M 1/466 (2013.01);
Abstract

An analog-to-digital converter (ADC) system can sample an input voltage for at least a first conversion into a first N-bit digital value and to use the same input voltage sample for at least a second conversion into a second N-bit digital value. A difference between a result of the first conversion and a result of the second conversion can be driven toward zero to adjust weights of one or more of the bits to calibrated values for use in one or more subsequent analog-to-digital conversions of subsequent samples of the input voltage. Shuffling, dithering, or the like can help ensure that at least a portion of the decision paths used in the second conversion are different from the decision paths used in the first conversion. Calibration can be performed in the background while the the ADC is converting in a normal mode of operation.


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