The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Jun. 03, 2016
Applicant:

Apple Inc., Cupertino, CA (US);

Inventor:

Dragos F. Botea, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G11C 29/08 (2006.01); G11C 7/10 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G11C 29/08 (2013.01); G11C 7/10 (2013.01); G11C 29/50 (2013.01);
Abstract

In some embodiments, a system includes a memory testing circuit configured to perform a test of an internal comparator of a memory circuit by performing operations. The operations may include causing a first value to be stored at the memory circuit as a current data value. The operations may further include subsequently causing the first value to be sent to the memory circuit as a current comparison data value. The operations may further include causing the internal comparator to compare the current data value to the current comparison data value. The operations may further include receiving a current match value that indicates whether the current data value matches the current comparison data value. In some embodiments, the memory testing circuit may be configured to enable a self-test circuit to detect errors regarding functions of the memory circuit that the self-test circuit is not designed to test.


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