The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Apr. 02, 2015
Hong Fu Jin Precision Industry (Wuhan) Co., Ltd., Wuhan, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Chun-Sheng Chen, New Taipei, TW;
Zhen-Sheng Wang, Wuhan, CN;
HONG FU JIN PRECISION INDUSTRY (WuHan) CO., LTD., Wuhan, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A testing apparatus to establish a fault by a process of elimination includes an input unit, a signal converting unit, a switch unit, and a display unit. The input unit receives an input signal and outputs a switch signal. The signal converting unit receives the switch signal and outputs a control signal. The switch unit receives the control signal and outputs a test signal. The display unit receives the test signal and runs a built in self test (BIST) program to test the proper functioning of the display unit. The signal converting unit outputs a data signal and a clock signal to the display unit when the display unit works normally. The signal converting unit not output the data signal and the clock signal to the display unit when the input signal and resulting control signal are repeated.