The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Dec. 18, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Andrew Docherty, St Leonards, AU;

James Austin Besley, Killara, AU;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G06T 7/003 (2013.01); G02B 21/367 (2013.01); G06K 9/00127 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01);
Abstract

A method of determining a coordinate transform between a first image and a second image, said method comprising the steps of: determining a rate of change of pixel values for locations on the first image to identify candidate alignment patches in the first image; specifying subsets of patches from the set of candidate alignment patches based on an error metric, selecting a subset of candidate alignment patches from said plurality of subsets of candidate alignment patches based upon a predetermined criterion; estimating, for each patch in the selected subset, a shift between the patch and a corresponding patch in the second image, the location of the corresponding patch in the second image being determined from the location of the patch in the first image; and determining the coordinate transform between the first image and second image based on the estimated shifts.


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