The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Jan. 15, 2014
Applicant:

The Boeing Company, Seal Beach, CA (US);

Inventor:

Philip L. Freeman, Summerville, SC (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06T 7/00 (2017.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); H04N 5/23229 (2013.01); G06T 2200/08 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A system for use in inspecting an object is provided. The system includes at least one array of visual imaging devices configured to capture a plurality of two-dimensional images of the object. The array is configured to capture a first set of two-dimensional images over a first predetermined interval and a second set of two-dimensional images over a second predetermined interval that is after the first predetermined interval. The system also includes a computing device coupled to the at least one array of visual imaging devices. The computing device is configured to extract point clouds of the object from the first and second sets of two-dimensional images, generate a three-dimensional model of the object from the extracted point clouds, determine variations in the extracted point clouds from the first and second sets of two-dimensional images, and utilize the determined variations to detect potential anomalies in the three-dimensional model.


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