The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
May. 16, 2013
Satake Corporation, Tokyo, JP;
Satake Corporation, , JP;
Abstract
A technical object is to enable optical checks to be performed while allowing visual checks using a sample pan to be performed in a pseudo manner using an aggregate image (pseudo image) depicting grains loaded on the sample pan, by optically checking the grains using image information on the grains imaged by an imaging apparatus and creating the aggregate image using the image information. Thus, a grain appearance measuring apparatus includes imaging means for imaging a plurality of grains, analysis means for analyzing image information on the grains imaged by the imaging means in units of grains, processing means for processing the image information to form an aggregate image of the grains, and means for saving and/or displaying the aggregate image processed by the processing means. The processing means extracts grain images from the image information in units of grains and arranges the extracted grain images in units of grains, in a close state where the grain images are close to one another to form an aggregate image of the grain images.