The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

May. 15, 2015
Applicant:

North Carolina State University, Raleigh, NC (US);

Inventors:

Dror Baron, Raleigh, NC (US);

Jin Tan, Raleigh, NC (US);

Yanting Ma, Raleigh, NC (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06T 5/00 (2006.01); G06T 9/00 (2006.01); H03M 7/30 (2006.01); H04N 19/85 (2014.01); H04N 19/90 (2014.01); H04N 19/80 (2014.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 9/00 (2013.01); H03M 7/3062 (2013.01); H04N 19/85 (2014.11); H04N 19/90 (2014.11); G06T 2207/20064 (2013.01); H04N 19/80 (2014.11);
Abstract

Various examples of methods and systems are provided for compressive imaging using approximate message passing with denoising. According to an aspect, a method includes applying an approximate message passing (AMP) conversion framework to a plurality of substantially linear measurements for conversion into a plurality of scalar measurements. A denoiser algorithm can be applied to the plurality of scalar measurements to generate a plurality of denoised scalar measurements. Further, a conversion term can be applied to the plurality of denoised scalar measurements for converting the plurality of denoised scalar measurements to a plurality of denoised substantially linear measurements. The plurality of substantially linear measurements can represent two-dimensional or three-dimensional signals.


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