The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Feb. 27, 2015
Kabushiki Kaisha Toshiba, Tokyo, JP;
Takahisa Nakano, Kanagawa, JP;
Tsutomu Saito, Kanagawa, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
According to one embodiment, an inspection apparatus includes an optical system portion on which a plurality of reflected light rays corresponding to a plurality of observation directions with respect to an optical variable image device are incident and which images the plurality of reflected light rays incident thereon, an imaging portion that images the plurality of reflected light rays imaged by the optical system portion and thereby generates reflected light images corresponding the plurality of respective observation directions, an object relation determination portion that determines whether or not there is a predetermined geometric difference between objects that are contained in reflected light images imaged by the imaging portion and corresponding to different observation directions, and an authenticity determination portion that determines authenticity of the optical variable image device based on a result of the determination by the object relation determination portion.