The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Mar. 14, 2012
Applicant:

Atsushi Irie, Nara, JP;

Inventor:

Atsushi Irie, Nara, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/66 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00281 (2013.01); G06K 9/00308 (2013.01); G06K 9/46 (2013.01); G06K 9/66 (2013.01);
Abstract

A feature value extraction section extracts a feature value from a pixel or a group of pixels of a sampling point for every plurality of sampling points for a reference point with respect to a region point on an image, and extracts a group of feature values with respect to the reference point; the location information identification section references an LRF function indicating a correspondence of the group of feature values with respect to the reference point and the location information indicating a relative location of the region point with respect to the reference point to identify the location information corresponding to the group of feature values extracted by the feature value extraction section, and the region point identification section assumes the location indicated by the location information identified by the location information identification section as a region point of the object.


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