The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Dec. 30, 2013
Applicant:

Roche Molecular Systems, Inc., Pleasanton, CA (US);

Inventor:

Ronald T. Kurnik, Foster City, CA (US);

Assignee:

Roche Molecular Systems, Inc., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/00 (2013.01); G01C 25/00 (2006.01); G01D 18/00 (2006.01); G01F 19/00 (2006.01); G06F 19/00 (2011.01); G06F 19/28 (2011.01); C12Q 1/68 (2006.01); G06F 19/24 (2011.01);
U.S. Cl.
CPC ...
G06F 19/28 (2013.01); C12Q 1/686 (2013.01); G06F 19/24 (2013.01);
Abstract

Systems, methods, and apparatuses are provided for detecting and potentially invalidating or correcting jump errors in data from growth processes. A jump error can be identified by determining a second derivative of the data set, and identifying two consecutive cycles with opposite signs in the second derivative. Once a jump error has been detected, the data set can be invalidated or corrected based on various criteria. Whether to invalidate or correct can be based on an absolute jump height, a relative jump height (e.g., relative to the net growth or relative to the baseline), an absolute location (cycle number) of the jump, or a relative location. In one implementation, the jump can be corrected by subtracting a jump height from points subsequent to the jump or by adding the jump height to points prior to the jump.


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