The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Feb. 28, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Yo-Han Roh, Hwaseong-si, KR;

Hyoung-Min Park, Seoul, KR;

Joo-Hyuk Jeon, Seoul, KR;

Seok-Jin Hong, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06K 9/62 (2006.01); G06F 19/24 (2011.01);
U.S. Cl.
CPC ...
G06F 17/30985 (2013.01); G06K 9/62 (2013.01); G06F 19/24 (2013.01);
Abstract

A method of searching a pattern in sequence data includes setting a plurality of interest pattern models each including an interest pattern length, an allowed mismatch value, and a minimum support; calculating a support of a candidate pattern that is generable within the interest pattern length based on the allowed mismatch value of at least one of the plurality of interest pattern models; and determining whether the support of the candidate pattern fulfills a condition of the minimum support of at least one of the plurality of interest pattern models.


Find Patent Forward Citations

Roh, Yo-Han. (2017). Method and apparatus for searching pattern in sequence data (U.S. Patent No. 9607106). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9607106

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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