The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Aug. 19, 2014
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Akihito Hamano, Bunkyo, JP;
Satoshi Aita, Kawasaki, JP;
Toshiki Okochi, Ohta, JP;
Ryu Kanehira, Kawasaki, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An effect analyzing program causes a management device that manages a plurality of resources to perform an operation to acquire, from a database that is used during an operation, the information on the resource and the information on a user who uses the resource, analyze the effect on a user due to a task during the task on the resource based on the acquired information on the resource and the acquired information on the user, and output the analyzed degree of effect, the acquired information on the resource and the acquired information on the user, whereby it is possible for an operator to efficiently determine the effect on a user due to a task performed on a resource.