The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Jul. 11, 2011
Applicant:

Maarten Weyn, Hove, BE;

Inventor:

Maarten Weyn, Hove, BE;

Assignee:

UNIVERSITEIT ANTWERPEN, Antwerp, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G01S 5/02 (2010.01); H04W 64/00 (2009.01);
U.S. Cl.
CPC ...
G06F 17/00 (2013.01); G01S 5/0252 (2013.01); G01S 5/0278 (2013.01); G01S 5/0294 (2013.01); H04W 64/00 (2013.01);
Abstract

A method and device for dynamically altering the signal-space-to-physical-space mapping database of a set of access points for use in localizing of an object, by obtaining a location profile for the object and obtaining an estimated location of an object by measuring the signal parameter induced by at least one access point and using the signal-space-to-physical-space mapping database for deriving an estimated location from the measured signal parameter, and determining whether the obtained estimated location complies with the obtained location profile for the object. If the obtained estimated location does not comply with the location profile, the mapping database is dynamically adjusted to obtain an adjusted signal-space-to-physical-space mapping database based on a difference between the measured signal parameter and the signal parameter corresponding with the signal space for the location expected based on the location profile.


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