The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Jul. 03, 2012
Akihiko Hyodo, Tokyo, JP;
Yasuo Sugure, Tokyo, JP;
Yasuhiro Ito, Tokyo, JP;
Tetsuya Yamada, Tokyo, JP;
Akihiko Hyodo, Tokyo, JP;
Yasuo Sugure, Tokyo, JP;
Yasuhiro Ito, Tokyo, JP;
Tetsuya Yamada, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Provided is a malfunction influence evaluation system comprising a controller simulator that simulates the operation of a controller, an input apparatus that provides input data to the controller simulator, a simulation manager that exercises integrated management of the operation of the input apparatus and the controller simulator, and a database wherein malfunction information and simulation conditions to be referred to by the simulation manager is stored. The controller simulator retains a control program for the controller and an analysis unit, and the analysis unit has a propagation flag tracking function wherein propagation flags are assigned to a variable within the control program, bits of the variable are set by inputting a prescribed value thereto as a malfunction input value, the bits are propagated each time the variable is involved in a calculation within the control program, the states of propagation of the bits are tracked, and the result thereof is output.