The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Sep. 04, 2015
Applicant:
Dell Products L.p., Round Rock, TX (US);
Inventors:
Dirie N. Herzi, Leander, TX (US);
Michael David Shepherd, Leander, TX (US);
Assignee:
Dell Products L.P., Round Rock, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/32 (2006.01); G06F 11/07 (2006.01); G06F 11/22 (2006.01); G06F 11/30 (2006.01); G06F 13/24 (2006.01);
U.S. Cl.
CPC ...
G06F 11/327 (2013.01); G06F 11/073 (2013.01); G06F 11/2231 (2013.01); G06F 11/3037 (2013.01); G06F 13/24 (2013.01);
Abstract
Defective memory may cause expensive and unnecessary replacements of the memory especially for higher density dynamic random access memory that has ever shrinking topologies. Running memory stress tests in the background for a period of time at set intervals while the operating system is idle may detect and identify memory problems in real-time without requiring a re-boot of the information handling system. The memory defects may be repaired in real-time so as not to cause loss of data by future read or write requests to the identified defective memory.