The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Oct. 31, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Wen C. Chen, Rhinebeck, NY (US);

Tsai-Yang Jea, Poughkeepsie, NY (US);

Wiliam P. LePera, Poughkeepsie, NY (US);

Hung Q. Thai, Bronx, NY (US);

Hanhong Xue, Wappingers Falls, NY (US);

Zhi Zhang, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01); G06F 9/50 (2006.01); G06F 9/46 (2006.01); G06F 9/52 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 9/5033 (2013.01); G06F 9/461 (2013.01); G06F 9/528 (2013.01); G06F 11/3433 (2013.01); G06F 2209/501 (2013.01);
Abstract

A method, apparatus and program product utilize an empirical approach to determine the locations of one or more IO adapters in an HPC environment. Performance tests may be run using a plurality of candidate mappings that map IO adapters to various locations in the HPC environment, and based upon the results of such testing, speculative adapter affinity information may be generated that assigns one or more IO adapters to one or more locations to optimize adapter affinity performance for subsequently-executed tasks.


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