The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Jan. 29, 2015
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventors:

Tatsushi Fukuda, Tokyo, JP;

Hiroyasu Hebiishi, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/33 (2006.01);
U.S. Cl.
CPC ...
G02B 21/33 (2013.01);
Abstract

It is an object of the present invention to provide a microscope that is capable of precisely controlling the amount of an immersion medium held in a gap between an objective lens and a mounting part, and that is capable of observing a specimen without varying the mounting part. The microscope includes a supply port from which an immersion medium is supplied to a gap between a film-like mounting part on which a specimen is loaded and an immersion objective lens, and a suction port that is arranged so as to be able to be brought into contact with an immersion medium supplied from the supply port, and from which the immersion medium can be sucked.


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