The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Aug. 02, 2013
Leica Microsystems (Schweiz) Ag, Heerbrugg, CH;
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Abstract
The invention relates to an incident illumination device for a microscope, for viewing a sample () in the microscope (), having a planar light source () for incident illumination of the sample (), wherein the planar light source () comprises a panel-shaped light guide having a lower boundary surface (), an upper boundary surface, and at least one lateral surface, as well as at least one light-emitting means that is arranged so that it irradiates light, via at least one lateral surface serving as a light entry surface, into the light guide in such a way that said light propagates in the light guide due to total reflection; wherein the total reflection is disrupted in defined fashion by an element abutting at the lower boundary surface of the light guide against a contact surface so that an outcoupling of light occurs at the upper boundary surface of the light guide.