The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Mar. 14, 2014
Applicant:
Anritsu Company, Morgan Hill, CA (US);
Inventor:
Jon S. Martens, San Jose, CA (US);
Assignee:
ANRITSU COMPANY, Morgan Hill, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01);
Abstract
A method for measuring scattering parameters in a device under test (DUT) using a vector network analyzer (VNA), includes calibrating the VNA to generate corrections for deterministic setup defects and mapping a plurality of error terms based on a plurality of time indices, wherein each time indicia is associated with an error term. A test signal is transmitted to the DUT to obtain a measurement signal from the DUT in response to the test signal. The generated corrections to obtained measurements are time aligned based on the mapped error terms.